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PhotonFirst’s fully automated PIC test

To help customers develop PIC-based solutions, PhotonFirst provides fully automated PIC testing capabilities. This service has the following three benefits:
• Rapid prototyping – we understand the value of fast iterations to quickly learn and improve designs
• Flexibility – ability to optically/electrically/thermally condition and probe the chip and characterize chip KPIs
• Automation – Collecting large data sets in a controlled and timely manner

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